Ron Schrimpf

Ronald D. Schrimpf

Professor of Electrical Engineering

Vanderbilt University

Box 1608, Station B

Nashville, TN 37235

Vanderbilt EECS Department

Ron Schrimpf is a Professor of Electrical Engineering at Vanderbilt University , where his research activities focus on microelectronics and semiconductor devices. In particular, he has a very active research program dealing with the effects of radiation on semiconductor devices and integrated circuits. The Radiation Effects and Reliability Group at Vanderbilt is the largest of its type at any US University. Current projects include application and development of Technology Computer Aided Design (TCAD) tools for radiation effects, use of high performance parallel computing to simulate single-event effects and soft errors in integrated circuits, atomic-scale modeling of radiation-induced defects, very low dose-rate (spacelike) effects on bipolar and MOS integrated circuits, total-dose and single-event effects in power devices and circuits, and development of radiation-effects and hardness-assurance test methodologies.

Ron is the Director of the Institute for Space and Defense Electronics (ISDE). The engineering staff of ISDE performs design, analysis, and modeling work for a variety of space- and defense-oriented organizations.

He received his BEE, MSEE, and Ph.D. degrees from the University of Minnesota in 1981, 1984, and 1986, respectively. He joined the University of Arizona in 1986, where he served as a Professor of Electrical and Computer Engineering. He joined Vanderbilt in 1996 and was an Invited Professor at the University of Montpellier II, France, in 2000


Contact Information

ron.schrimpf@vanderbilt.edu

Phone: (615) 343-0507

Fax: (615) 343-0601


Honors and Awards


Selected Professional Activities


Publications

Journal Articles and Book Chapters

1985, 1986, 1987, 1988, 1989, 1990, 1991, 1992, 1993, 1994, 1995, 1996, 1997, 1998, 1999, 2000, 2001, 2002, 2003, 2004, 2005, 2006, 2007

Conference Proceedings and Presentations

1986, 1987, 1988, 1989, 1990, 1991, 1992, 1993, 1994, 1995, 1996, 1997, 1998, 1999, 2000, 2001, 2002, 2003, 2004, 2005, 2006

Book

R. D. Schrimpf and D. M. Fleetwood, Eds., "Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices," World Scientific, Singapore, 2004.

Patents