Current Graduate Students

Qian (Daniel) Ding is currently a doctoral student at Vanderbilt University. He received a Bachelor of Engineering degree in computer communication from Sichuan University in 2003 and a Master of Science degree from South Dakota School of Mines and Technology in 2006. His research interests include VLSI design, neural networks, and Field Programmable Gate Arrays (FPGAs).

Daniel B. Limbrick is currently a doctoral student in the Radiation Effects and Reliability Group at Vanderbilt University. He received a Bachelor of Science degree in electrical engineering from Texas A & M University in 2007. In addition, he received a Master of Science degree in electrical engineering from Vanderbilt University in December 2009. His research interests include radiation-hardening by design and soft error mitigation in multicore microprocessors.

Trey Reece is currently a doctoral student at Vanderbilt University. He received a Bachelor of Science degree in electrical engineering from Vanderbilt University in 2007. He also received a Master of Science degree in electrical engineering from Vanderbilt in December 2009. His research interests include detecting malicious hardware circuits.

Xiaowen Wang is currently a master's student at Vanderbilt University. Her research interests include VLSI design for low-power applications.

Zhengyu Yang is currently a doctoral student at Vanderbilt University. His research interests include embedded systems for hardware security.

 

Alumni

Olabode Ajiboye earned his Master of Science degree in Summer 2009 at Vanderbilt University. He also received a Bachelor of Science degree in electrical engineering from Vanderbilt University in 2007. His research interests include wireless sensor networks.

Jeffrey D. Black earned his doctoral degree at Vanderbilt University in August 2008. He is currently a Senior Research Engineer in the Institute for Space and Defense Electronics (ISDE). He received a Bachelor of Science degree in electrical engineering in 1988 from the United States Air Force Academy. He received a Master of Science degree in electrical engineering from the University of New Mexico in 1991. His research interests include single event effects in microelectronics.

Julian W. Farquharson is a former member of the Radiation Effects and Reliability Group at Vanderbilt University. He earned his Master of Science degree in Summer 2007. He received a Bachelor of Science degree in electrical engineering from Prairie View Agricultural and Mechanical University in 2002. His research interests include Field Programmable Gate Arrays (FPGAs) and computer architecture design.

Adrian P. Lauf is currently a doctoral student in the Institute for Software Integrated Systems (ISIS) at Vanderbilt University. He received a Bachelor of Science degree in electrical engineering in 2005 and his Master of Science Degree in 2007, both from Vanderbilt University. His research interests include embedded systems and intelligent intrusion detection systems.

George E. Sewell earned his Master of Science degree in Summer 2007 at Vanderbilt University. He also received a Bachelor of Science degree in electrical engineering from Vanderbilt University in 2005. His research interests include Field Programmable Gate Arrays (FPGAs).

Varadarajan Srinivasan is a former member of the Radiation Effects and Reliability Group at Vanderbilt University. He earned his Master of Science degree in Spring 2006. He received a Bachelor of Engineering degree in electrical and electronics engineering from University of Madras, India in 2003. His research interests include Single Event Effects (SEE) in combinational logic circuits, scaling issues for Single Event Upset (SEU) vulnerability, architectural dependence on SEU vulnerability, and error correction codes.

For more information, please contact Dr. William H. Robinson